Abstract
A solid-on-solid interface representation of the random-field Ising model is studied numerically in two dimensions. The interface width varies linearly with sample size, in agreement with simple energy-accounting arguments and recent theories which predict that two is the lower critical dimension of the random-field Ising model.
| Original language | English |
|---|---|
| Pages (from-to) | 203-206 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 51 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1983 |
| Externally published | Yes |
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