Abstract
We report on measurements of the conductivity as a function of electric field and temperature in strongly-localized In2O3-x films. At low temperatures and sufficiently intense fields, the conductivity is found to be temperature independent and the current-voltage characteristics follow the form suggested by Shklovskii in three as well as in two-dimensional samples.
Original language | English |
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Pages (from-to) | 823-826 |
Number of pages | 4 |
Journal | Solid State Communications |
Volume | 67 |
Issue number | 8 |
DOIs | |
State | Published - Aug 1988 |