Abstract
We report on measurements of the conductivity as a function of electric field and temperature in strongly-localized In2O3-x films. At low temperatures and sufficiently intense fields, the conductivity is found to be temperature independent and the current-voltage characteristics follow the form suggested by Shklovskii in three as well as in two-dimensional samples.
| Original language | English |
|---|---|
| Pages (from-to) | 823-826 |
| Number of pages | 4 |
| Journal | Solid State Communications |
| Volume | 67 |
| Issue number | 8 |
| DOIs | |
| State | Published - Aug 1988 |