Abstract
We demonstrate an approach for on-chip beam positioning with a position accuracy of up to 100 nm. This approach is based on tracking the resonance of two adjacent microring resonators that are implemented on a silicon on insulator chip. We demonstrate the functionality of our approach by illuminating the chip through a Near Field Scanning Optical Microscope tip and monitoring the shift of the microring resonances due to the thermo-optic effect. We also discuss the contribution of different effects such as free carrier absorption and dispersion to the resonance shift.
Original language | English |
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Article number | 201112 |
Journal | Applied Physics Letters |
Volume | 112 |
Issue number | 20 |
DOIs | |
State | Published - 14 May 2018 |
Bibliographical note
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