Abstract
We demonstrate an approach for on-chip beam positioning with a position accuracy of up to 100 nm. This approach is based on tracking the resonance of two adjacent microring resonators that are implemented on a silicon on insulator chip. We demonstrate the functionality of our approach by illuminating the chip through a Near Field Scanning Optical Microscope tip and monitoring the shift of the microring resonances due to the thermo-optic effect. We also discuss the contribution of different effects such as free carrier absorption and dispersion to the resonance shift.
| Original language | English |
|---|---|
| Article number | 201112 |
| Journal | Applied Physics Letters |
| Volume | 112 |
| Issue number | 20 |
| DOIs | |
| State | Published - 14 May 2018 |
Bibliographical note
Publisher Copyright:© 2018 Author(s).
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