On-Die Telemetry Circuitry for Measuring Clock Tree Timing Deterioration Due to Asymmetric Transistor Aging

D Wattad, S Kvatinsky, F Gabbay

The Institute of Applied Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	6th International Conference on Microelectronic Devices and Technologies (MicDAT '2024)
Subtitle of host publication	25-27 September 2024, Ibiza (Balearic Islands), Spain
Pages	22
Number of pages	1
State	Published - 2024

Publication series

Name	Microelectronic Devices and Technologies

Access to Document

https://www.researchgate.net/profile/Sergey-Yurish/publication/384863083_Microelectronic_Devices_and_Technologies_Proceedings_of_the_6th_International_Conference_on_Microelectronic_Devices_and_Technologies_MicDAT_'2024_Ibiza_Balearic_Islands_Spain_Edited_by_Sergey_Y_Yurish/links/670a818ba1215201916a997f/Microelectronic-Devices-and-Technologies-Proceedings-of-the-6th-International-Conference-on-Microelectronic-Devices-and-Technologies-MicDAT-2024-Ibiza-Balearic-Islands-Spain-Edited-by-Sergey-Y-Yuris.pdf#page=22

Cite this

Wattad, D., Kvatinsky, S., & Gabbay, F. (2024). On-Die Telemetry Circuitry for Measuring Clock Tree Timing Deterioration Due to Asymmetric Transistor Aging. In 6th International Conference on Microelectronic Devices and Technologies (MicDAT '2024): 25-27 September 2024, Ibiza (Balearic Islands), Spain (pp. 22). (Microelectronic Devices and Technologies). https://www.researchgate.net/profile/Sergey-Yurish/publication/384863083_Microelectronic_Devices_and_Technologies_Proceedings_of_the_6th_International_Conference_on_Microelectronic_Devices_and_Technologies_MicDAT_'2024_Ibiza_Balearic_Islands_Spain_Edited_by_Sergey_Y_Yurish/links/670a818ba1215201916a997f/Microelectronic-Devices-and-Technologies-Proceedings-of-the-6th-International-Conference-on-Microelectronic-Devices-and-Technologies-MicDAT-2024-Ibiza-Balearic-Islands-Spain-Edited-by-Sergey-Y-Yuris.pdf#page=22

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title = "On-Die Telemetry Circuitry for Measuring Clock Tree Timing Deterioration Due to Asymmetric Transistor Aging",

author = "D Wattad and S Kvatinsky and F Gabbay",

year = "2024",

language = "אנגלית",

series = "Microelectronic Devices and Technologies",

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Wattad, D, Kvatinsky, S & Gabbay, F 2024, On-Die Telemetry Circuitry for Measuring Clock Tree Timing Deterioration Due to Asymmetric Transistor Aging. in 6th International Conference on Microelectronic Devices and Technologies (MicDAT '2024): 25-27 September 2024, Ibiza (Balearic Islands), Spain . Microelectronic Devices and Technologies, pp. 22. <https://www.researchgate.net/profile/Sergey-Yurish/publication/384863083_Microelectronic_Devices_and_Technologies_Proceedings_of_the_6th_International_Conference_on_Microelectronic_Devices_and_Technologies_MicDAT_'2024_Ibiza_Balearic_Islands_Spain_Edited_by_Sergey_Y_Yurish/links/670a818ba1215201916a997f/Microelectronic-Devices-and-Technologies-Proceedings-of-the-6th-International-Conference-on-Microelectronic-Devices-and-Technologies-MicDAT-2024-Ibiza-Balearic-Islands-Spain-Edited-by-Sergey-Y-Yuris.pdf#page=22>

On-Die Telemetry Circuitry for Measuring Clock Tree Timing Deterioration Due to Asymmetric Transistor Aging. / Wattad, D; Kvatinsky, S; Gabbay, F.
6th International Conference on Microelectronic Devices and Technologies (MicDAT '2024): 25-27 September 2024, Ibiza (Balearic Islands), Spain . 2024. p. 22 (Microelectronic Devices and Technologies).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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