Overview of Target Normal Sheath Acceleration Experiments and Diagnostics at SPARC_LAB

  • Federica Stocchi*
  • , Maria Pia Anania
  • , Fabrizio Bisesto
  • , Alessandro Cianchi
  • , Mattia Cipriani
  • , Fabrizio Consoli
  • , Gemma Costa
  • , Alessandro Curcio
  • , Mario Galletti
  • , Riccardo Pompili
  • , Martina Salvadori
  • , Claudio Verona
  • , Arie Zigler
  • , Massimo Ferrario
  • *Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

Abstract

The interaction of an ultra-short, high-power laser pulse with a solid target, in the so-called Target Normal Sheath Acceleration (TNSA) configuration, produces particles in the MeV range. Fast electrons can escape from the target after the interaction, inducing electrostatic fields on the order of TV/m close to the target surface. These fields accelerate MeV protons and heavy ions at the rear of the target, allowing them to escape. The complete process is difficult to probe, as it occurs on the sub-ps timescale. At the INFN-LNF SPARC_LAB test facility, single-shot diagnostics such as the Electro-Optic Sampling (EOS) are being developed and tested for time-resolved direct measurements of the produced electrons and associated longitudinal electric fields. Electrons are the core of the process, and their properties determine the following production of positive charge particles and electromagnetic radiation. Different target geometries and materials are being investigated to analyze the enhancement of fast electron emission and the correlation with positive charge production. Simultaneous observations of electron and proton beams have been performed using two diagnostic lines, the EOS for electrons and a time-of-flight (TOF) detector for protons. This work provides an overview of the previous experiments performed at SPARC_LAB dedicated to the TNSA characterization.

Original languageEnglish
Article number13001
JournalApplied Sciences (Switzerland)
Volume15
Issue number24
DOIs
StatePublished - Dec 2025

Bibliographical note

Publisher Copyright:
© 2025 by the authors.

Keywords

  • TNSA
  • beam diagnostics
  • laser diagnostics
  • particle accelerator
  • plasma diagnostics

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