PbS nanodots embedded in ZrO2 thin films for ultraviolet radiation dosimetry

Yu Dekhtyar; M. Romanova; A. Anischenko; A. Sudnikovich; N. Polyaka; R. Reisfeld; T. Saraidarov; B. Polyakov

doi:10.1007/978-3-642-23508-5_338

PbS nanodots embedded in ZrO2 thin films for ultraviolet radiation dosimetry

Yu Dekhtyar^*, M. Romanova, A. Anischenko, A. Sudnikovich, N. Polyaka, R. Reisfeld, T. Saraidarov, B. Polyakov

^*Corresponding author for this work

Institute of Chemistry

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

PbS nanodots embedded in ZrO₂ thin film matrix (ZrO2:PbS films) were investigated for UV radiation dosimetry purposes. ZrO2:PbS films were UV irradiated using wavelengths 250 - 400 nm. Photoelectron emission spectra of ZrO₂:PbS films were recorded and band structure of the films was calculated. It was found that density of localized states increased with increase in concentration of PbS nanodots which allowed to suggest that PbS nanodots are responsible for creation of localized states. Number of localized states decreased after UV irradiation. The linear correlation between number of localized states and time of UV exposure was observed. Observed changes in band structure of ZrO₂:PbS films under the influence of UV irradiation suggest that the films may be considered as an effective material for UV radiation dosimetry, PbS nanodots being the UV sensitive substance of the films.

Original language	English
Pages (from-to)	1307-1310
Number of pages	4
Journal	IFMBE Proceedings
Volume	37
DOIs	https://doi.org/10.1007/978-3-642-23508-5_338
State	Published - 2011

Keywords

PbS nanodots
dosimetry
photoelectron emission
ultraviolet radiation

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10.1007/978-3-642-23508-5_338

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title = "PbS nanodots embedded in ZrO2 thin films for ultraviolet radiation dosimetry",

abstract = "PbS nanodots embedded in ZrO2 thin film matrix (ZrO2:PbS films) were investigated for UV radiation dosimetry purposes. ZrO2:PbS films were UV irradiated using wavelengths 250 - 400 nm. Photoelectron emission spectra of ZrO2:PbS films were recorded and band structure of the films was calculated. It was found that density of localized states increased with increase in concentration of PbS nanodots which allowed to suggest that PbS nanodots are responsible for creation of localized states. Number of localized states decreased after UV irradiation. The linear correlation between number of localized states and time of UV exposure was observed. Observed changes in band structure of ZrO2:PbS films under the influence of UV irradiation suggest that the films may be considered as an effective material for UV radiation dosimetry, PbS nanodots being the UV sensitive substance of the films.",

keywords = "PbS nanodots, dosimetry, photoelectron emission, ultraviolet radiation",

author = "Yu Dekhtyar and M. Romanova and A. Anischenko and A. Sudnikovich and N. Polyaka and R. Reisfeld and T. Saraidarov and B. Polyakov",

year = "2011",

doi = "10.1007/978-3-642-23508-5_338",

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T1 - PbS nanodots embedded in ZrO2 thin films for ultraviolet radiation dosimetry

AU - Dekhtyar, Yu

AU - Romanova, M.

AU - Anischenko, A.

AU - Sudnikovich, A.

AU - Polyaka, N.

AU - Reisfeld, R.

AU - Saraidarov, T.

AU - Polyakov, B.

PY - 2011

Y1 - 2011

N2 - PbS nanodots embedded in ZrO2 thin film matrix (ZrO2:PbS films) were investigated for UV radiation dosimetry purposes. ZrO2:PbS films were UV irradiated using wavelengths 250 - 400 nm. Photoelectron emission spectra of ZrO2:PbS films were recorded and band structure of the films was calculated. It was found that density of localized states increased with increase in concentration of PbS nanodots which allowed to suggest that PbS nanodots are responsible for creation of localized states. Number of localized states decreased after UV irradiation. The linear correlation between number of localized states and time of UV exposure was observed. Observed changes in band structure of ZrO2:PbS films under the influence of UV irradiation suggest that the films may be considered as an effective material for UV radiation dosimetry, PbS nanodots being the UV sensitive substance of the films.

AB - PbS nanodots embedded in ZrO2 thin film matrix (ZrO2:PbS films) were investigated for UV radiation dosimetry purposes. ZrO2:PbS films were UV irradiated using wavelengths 250 - 400 nm. Photoelectron emission spectra of ZrO2:PbS films were recorded and band structure of the films was calculated. It was found that density of localized states increased with increase in concentration of PbS nanodots which allowed to suggest that PbS nanodots are responsible for creation of localized states. Number of localized states decreased after UV irradiation. The linear correlation between number of localized states and time of UV exposure was observed. Observed changes in band structure of ZrO2:PbS films under the influence of UV irradiation suggest that the films may be considered as an effective material for UV radiation dosimetry, PbS nanodots being the UV sensitive substance of the films.

KW - PbS nanodots

KW - dosimetry

KW - photoelectron emission

KW - ultraviolet radiation

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JF - IFMBE Proceedings

ER -

PbS nanodots embedded in ZrO2 thin films for ultraviolet radiation dosimetry

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Keywords

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