Abstract
Photo-electro-magnetic effect measurements of p-type Hg 1-xCdxTe layers are made at 80 K as a function of the magnetic field. A negative (anomalous) effect is observed. The basic properties of the minority carriers, mobility, lifetime, surface and interface recombination rates, are determined from best fitting of the experimental data to the theory.
Original language | English |
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Pages (from-to) | 2239-2241 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 51 |
Issue number | 26 |
DOIs | |
State | Published - 1987 |