Plasma imaging in the XUV wavelength range (175Å) using curved layered synthetic microstructure coated surfaces

S. P. Regan, L. K. Huang, M. Finkenthal, H. W. Moos, T. W. Barbee

Research output: Contribution to journalConference articlepeer-review

Abstract

A recently constructed calibration facility utilizing a Manson Soft X-ray Line Source in the wavelength range of 8-114Å and a Penning Ionization Discharge (PID) in the 100-350 Å range, has been used to map the reflectivity across a spherically curved (50cm radius of curvature) Layered Synthetic Microstructure (LSM) Mo/Si coated surface. This calibrated mirror (37% reflectivity with a 10Å bandpass at λ=175Å) was also used to image the Alin emission (λ= 170-175Å) from the PID.

Original languageEnglish
Pages (from-to)322-326
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1546
DOIs
StatePublished - 1 Jan 1992
EventMultilayer and Grazing Incidence X-Ray/EUV Optics 1991 - San Diego, United States
Duration: 21 Jul 1991 → …

Bibliographical note

Publisher Copyright:
© 1992 SPIE. All rights reserved.

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