Plasma imaging in the XUV wavelength range (175Å) using curved layered synthetic microstructure coated surfaces

S. P. Regan; L. K. Huang; M. Finkenthal; H. W. Moos; T. W. Barbee

doi:10.1117/12.51250

Plasma imaging in the XUV wavelength range (175Å) using curved layered synthetic microstructure coated surfaces

S. P. Regan
, L. K. Huang
, M. Finkenthal
, H. W. Moos
, T. W. Barbee

Racah Institute of Physics

Research output: Contribution to journal › Conference article › peer-review

Abstract

A recently constructed calibration facility utilizing a Manson Soft X-ray Line Source in the wavelength range of 8-114Å and a Penning Ionization Discharge (PID) in the 100-350 Å range, has been used to map the reflectivity across a spherically curved (50cm radius of curvature) Layered Synthetic Microstructure (LSM) Mo/Si coated surface. This calibrated mirror (37% reflectivity with a 10Å bandpass at λ=175Å) was also used to image the Alin emission (λ= 170-175Å) from the PID.

Original language	English
Pages (from-to)	322-326
Number of pages	5
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1546
DOIs	https://doi.org/10.1117/12.51250
State	Published - 1 Jan 1992
Event	Multilayer and Grazing Incidence X-Ray/EUV Optics 1991 - San Diego, United States Duration: 21 Jul 1991 → …

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© 1992 SPIE. All rights reserved.

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title = "Plasma imaging in the XUV wavelength range (175{\AA}) using curved layered synthetic microstructure coated surfaces",

abstract = "A recently constructed calibration facility utilizing a Manson Soft X-ray Line Source in the wavelength range of 8-114{\AA} and a Penning Ionization Discharge (PID) in the 100-350 {\AA} range, has been used to map the reflectivity across a spherically curved (50cm radius of curvature) Layered Synthetic Microstructure (LSM) Mo/Si coated surface. This calibrated mirror (37\% reflectivity with a 10{\AA} bandpass at λ=175{\AA}) was also used to image the Alin emission (λ= 170-175{\AA}) from the PID.",

author = "Regan, \{S. P.\} and Huang, \{L. K.\} and M. Finkenthal and Moos, \{H. W.\} and Barbee, \{T. W.\}",

year = "1992",

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doi = "10.1117/12.51250",

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AU - Regan, S. P.

AU - Huang, L. K.

AU - Finkenthal, M.

AU - Moos, H. W.

AU - Barbee, T. W.

PY - 1992/1/1

Y1 - 1992/1/1

N2 - A recently constructed calibration facility utilizing a Manson Soft X-ray Line Source in the wavelength range of 8-114Å and a Penning Ionization Discharge (PID) in the 100-350 Å range, has been used to map the reflectivity across a spherically curved (50cm radius of curvature) Layered Synthetic Microstructure (LSM) Mo/Si coated surface. This calibrated mirror (37% reflectivity with a 10Å bandpass at λ=175Å) was also used to image the Alin emission (λ= 170-175Å) from the PID.

AB - A recently constructed calibration facility utilizing a Manson Soft X-ray Line Source in the wavelength range of 8-114Å and a Penning Ionization Discharge (PID) in the 100-350 Å range, has been used to map the reflectivity across a spherically curved (50cm radius of curvature) Layered Synthetic Microstructure (LSM) Mo/Si coated surface. This calibrated mirror (37% reflectivity with a 10Å bandpass at λ=175Å) was also used to image the Alin emission (λ= 170-175Å) from the PID.

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JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Multilayer and Grazing Incidence X-Ray/EUV Optics 1991

Y2 - 21 July 1991

ER -

Plasma imaging in the XUV wavelength range (175Å) using curved layered synthetic microstructure coated surfaces

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