Plasmon confinement in atomically thin and flat metallic films

T. Nagao*, S. Yaginuma, C. Liu, T. Inaoka, V. U. Nazarov, T. Nakayama, M. Aono

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

We report on the direct measurement of dispersion relations of plasmons confined in atomically thin metal films and wires by electron energy loss spectroscopy in wide energy-momentum range. Ultrathin Ag films are prepared on single crystal Si surfaces by molecular beam epitaxy, and its crystallinity is checked by electron diffraction. For the case of multi-atomic-layer Ag films, two plasmon modes are observed at around 3.9 eV and 1.8 eV which are localized at the top and the bottom surfaces of the films, respectively. For the case of Ag monoatomic layer, a single mode is observed that steeply disperses in the mid-infrared range. Nonlocal and quantum effects are found to be essential in understanding its full plasmon dispersion curve up to the critical wave number of Landau damping. For the case of Au atom chains, an anisotropic sound-wave-like plasmon dispersion is found that clearly shows ID plasmon confinement in each atom chain.

Original languageAmerican English
Title of host publicationPlasmonics
Subtitle of host publicationMetallic Nanostructures and Their Optical Properties V
DOIs
StatePublished - 2007
Externally publishedYes
EventPlasmonics: Metallic Nanostructures and Their Optical Properties V - San Diego, CA, United States
Duration: 26 Aug 200729 Aug 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6641
ISSN (Print)0277-786X

Conference

ConferencePlasmonics: Metallic Nanostructures and Their Optical Properties V
Country/TerritoryUnited States
CitySan Diego, CA
Period26/08/0729/08/07

Keywords

  • Electron energy loss spectroscopy
  • Epitaxial growth
  • Low-dimensional materials
  • Plasmon dispersion
  • Silicon
  • Silver

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