Polyaniline Langmuir-Blodgett films: Formation and properties

Jie Zhang, David P. Burt, Anna L. Whitworth, Daniel Mandler*, Patrick R. Unwin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

27 Scopus citations


The deposition and characterisation of Langmuir-Blodgett (LB) layers of polyaniline (PAN) on solid supports is described. Langmuir films were spread as a mixture of PAN and dodecylbenzenesulfonic acid (DBSA) at the water/air interface and deposited on either glass or indium tin oxide (ITO). Mono- and multi-layer films of PAN/DBSA were characterized by X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), absorption spectroscopy and cyclic voltammetry (CV). The ultrathin films produced were found to be highly uniform and very stable. Further characterisation of the films was accomplished by scanning electrochemical microscopy (SECM) in the feedback mode. It was found that the conductivity depended strongly on the pH of the solution and the number of layers deposited. Values for the pH-dependent lateral conductivity of PAN LB films are reported.

Original languageAmerican English
Pages (from-to)3490-3496
Number of pages7
JournalPhysical Chemistry Chemical Physics
Issue number18
StatePublished - 2009


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