Polyaniline Langmuir-Blodgett films: Formation and properties

Jie Zhang; David P. Burt; Anna L. Whitworth; Daniel Mandler; Patrick R. Unwin

doi:10.1039/b819809h

Polyaniline Langmuir-Blodgett films: Formation and properties

Jie Zhang, David P. Burt, Anna L. Whitworth, Daniel Mandler^*, Patrick R. Unwin

^*Corresponding author for this work

Institute of Chemistry

Research output: Contribution to journal › Article › peer-review

27 Scopus citations

Abstract

The deposition and characterisation of Langmuir-Blodgett (LB) layers of polyaniline (PAN) on solid supports is described. Langmuir films were spread as a mixture of PAN and dodecylbenzenesulfonic acid (DBSA) at the water/air interface and deposited on either glass or indium tin oxide (ITO). Mono- and multi-layer films of PAN/DBSA were characterized by X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), absorption spectroscopy and cyclic voltammetry (CV). The ultrathin films produced were found to be highly uniform and very stable. Further characterisation of the films was accomplished by scanning electrochemical microscopy (SECM) in the feedback mode. It was found that the conductivity depended strongly on the pH of the solution and the number of layers deposited. Values for the pH-dependent lateral conductivity of PAN LB films are reported.

Original language	English
Pages (from-to)	3490-3496
Number of pages	7
Journal	Physical Chemistry Chemical Physics
Volume	11
Issue number	18
DOIs	https://doi.org/10.1039/b819809h
State	Published - 2009

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@article{36834cd478fd47e784a5f4dc86706092,

title = "Polyaniline Langmuir-Blodgett films: Formation and properties",

abstract = "The deposition and characterisation of Langmuir-Blodgett (LB) layers of polyaniline (PAN) on solid supports is described. Langmuir films were spread as a mixture of PAN and dodecylbenzenesulfonic acid (DBSA) at the water/air interface and deposited on either glass or indium tin oxide (ITO). Mono- and multi-layer films of PAN/DBSA were characterized by X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), absorption spectroscopy and cyclic voltammetry (CV). The ultrathin films produced were found to be highly uniform and very stable. Further characterisation of the films was accomplished by scanning electrochemical microscopy (SECM) in the feedback mode. It was found that the conductivity depended strongly on the pH of the solution and the number of layers deposited. Values for the pH-dependent lateral conductivity of PAN LB films are reported.",

author = "Jie Zhang and Burt, {David P.} and Whitworth, {Anna L.} and Daniel Mandler and Unwin, {Patrick R.}",

year = "2009",

doi = "10.1039/b819809h",

language = "אנגלית",

volume = "11",

pages = "3490--3496",

journal = "Physical Chemistry Chemical Physics",

issn = "1463-9076",

publisher = "Royal Society of Chemistry",

number = "18",

}

TY - JOUR

T1 - Polyaniline Langmuir-Blodgett films

T2 - Formation and properties

AU - Zhang, Jie

AU - Burt, David P.

AU - Whitworth, Anna L.

AU - Mandler, Daniel

AU - Unwin, Patrick R.

PY - 2009

Y1 - 2009

N2 - The deposition and characterisation of Langmuir-Blodgett (LB) layers of polyaniline (PAN) on solid supports is described. Langmuir films were spread as a mixture of PAN and dodecylbenzenesulfonic acid (DBSA) at the water/air interface and deposited on either glass or indium tin oxide (ITO). Mono- and multi-layer films of PAN/DBSA were characterized by X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), absorption spectroscopy and cyclic voltammetry (CV). The ultrathin films produced were found to be highly uniform and very stable. Further characterisation of the films was accomplished by scanning electrochemical microscopy (SECM) in the feedback mode. It was found that the conductivity depended strongly on the pH of the solution and the number of layers deposited. Values for the pH-dependent lateral conductivity of PAN LB films are reported.

AB - The deposition and characterisation of Langmuir-Blodgett (LB) layers of polyaniline (PAN) on solid supports is described. Langmuir films were spread as a mixture of PAN and dodecylbenzenesulfonic acid (DBSA) at the water/air interface and deposited on either glass or indium tin oxide (ITO). Mono- and multi-layer films of PAN/DBSA were characterized by X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), absorption spectroscopy and cyclic voltammetry (CV). The ultrathin films produced were found to be highly uniform and very stable. Further characterisation of the films was accomplished by scanning electrochemical microscopy (SECM) in the feedback mode. It was found that the conductivity depended strongly on the pH of the solution and the number of layers deposited. Values for the pH-dependent lateral conductivity of PAN LB films are reported.

UR - http://www.scopus.com/inward/record.url?scp=65349165140&partnerID=8YFLogxK

U2 - 10.1039/b819809h

DO - 10.1039/b819809h

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:65349165140

SN - 1463-9076

VL - 11

SP - 3490

EP - 3496

JO - Physical Chemistry Chemical Physics

JF - Physical Chemistry Chemical Physics

IS - 18

ER -

Polyaniline Langmuir-Blodgett films: Formation and properties

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