Positive identification of XeH- molecular ion

E. Boaretto*, D. Berkovits, G. Hollos, M. Paul

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

We describe in the present work the observation of XeH- molecular ions from a standard Hiconex 834 source in which a sputter target of AgI mixed with Ag was sprayed with Xe gas. The formation of XeH- ions is positively demonstrated by identifying 129Xe and 131Xe by AMS analysis and energy and time-of-flight measurements, when negative ions of mass 130 and 132, respectively, are injected into the 14UD Rehovot Pelletron tandem accelerator. No evidence for the formation of Xe- ions was found. The dependence of the intensity of the xenon group on the xenon gas pressure in the ion source shows that the probability of formation of XeH- is very low and should not pose a significant background problem under normal circumstances in AMS measurements of 129I.

Original languageEnglish
Pages (from-to)421-423
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume52
Issue number3-4
DOIs
StatePublished - 2 Dec 1990

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