TY - JOUR
T1 - Preparation and Characterization of the Halogen-Bonding Motif in the Isolated Cl-·IOH Complex with Cryogenic Ion Vibrational Spectroscopy
AU - Stropoli, Santino J.
AU - Khuu, Thien
AU - Messinger, Joseph P.
AU - Karimova, Natalia V.
AU - Boyer, Mark A.
AU - Zakai, Itai
AU - Mitra, Sayoni
AU - Lachowicz, Anton L.
AU - Yang, Nan
AU - Edington, Sean C.
AU - Gerber, R. Benny
AU - McCoy, Anne B.
AU - Johnson, Mark A.
N1 - Publisher Copyright:
© 2022 American Chemical Society. All rights reserved.
PY - 2022/3/31
Y1 - 2022/3/31
N2 - In the presence of a halide ion, hypohalous acids can adopt two binding motifs upon formation of the ion-molecule complexes [XHOY]-(X, Y = Cl, Br, I): a hydrogen (HB) bond to the acid OH group and a halogen (XB) bond between the anion and the acid halogen. Here we isolate the X-bonded Cl-·IOH ion-molecule complex by collisions of I-·(H2O)nclusters with HOCl vapor and measure its vibrational spectrum by IR photodissociation of the H2-tagged complex. Anharmonic analysis of its vibrational band pattern reveals that formation of the XB complex results in dramatic lowering of the HOI bending fundamental frequency and elongation of the O-I bond (by 168 cm-1and 0.13 Å, respectively, relative to isolated HOI).
AB - In the presence of a halide ion, hypohalous acids can adopt two binding motifs upon formation of the ion-molecule complexes [XHOY]-(X, Y = Cl, Br, I): a hydrogen (HB) bond to the acid OH group and a halogen (XB) bond between the anion and the acid halogen. Here we isolate the X-bonded Cl-·IOH ion-molecule complex by collisions of I-·(H2O)nclusters with HOCl vapor and measure its vibrational spectrum by IR photodissociation of the H2-tagged complex. Anharmonic analysis of its vibrational band pattern reveals that formation of the XB complex results in dramatic lowering of the HOI bending fundamental frequency and elongation of the O-I bond (by 168 cm-1and 0.13 Å, respectively, relative to isolated HOI).
UR - http://www.scopus.com/inward/record.url?scp=85127587893&partnerID=8YFLogxK
U2 - 10.1021/acs.jpclett.2c00218
DO - 10.1021/acs.jpclett.2c00218
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C2 - 35315676
AN - SCOPUS:85127587893
SN - 1948-7185
VL - 13
SP - 2750
EP - 2756
JO - Journal of Physical Chemistry Letters
JF - Journal of Physical Chemistry Letters
IS - 12
ER -