Abstract
CdS quantum dots were prepared in glass films obtained from tetramethoxysilane (TMOS) or from tetraethoxysilane (TEOS) of typical thickness of 0.1-0.2 μm. Diameters of the particles were evaluated from X-ray diffraction and from transmission electron microscopy and correlated with inflection points on the absorption spectra. The lowest quantum states are estimated and nonlinear optical properties measured.
Original language | English |
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Pages (from-to) | 277-282 |
Number of pages | 6 |
Journal | Chemical Physics Letters |
Volume | 183 |
Issue number | 3-4 |
DOIs | |
State | Published - 30 Aug 1991 |