Quantum dots of cadmium sulfide in thin glass films prepared by sol-gel technique

Harry Minti; Marek Eyal; Renata Reisfeld; Garry Berkovic

doi:10.1016/0009-2614(91)80063-4

Quantum dots of cadmium sulfide in thin glass films prepared by sol-gel technique

Harry Minti^*
, Marek Eyal
, Renata Reisfeld
, Garry Berkovic

^*Corresponding author for this work

Institute of Chemistry

Research output: Contribution to journal › Article › peer-review

62 Scopus citations

Abstract

CdS quantum dots were prepared in glass films obtained from tetramethoxysilane (TMOS) or from tetraethoxysilane (TEOS) of typical thickness of 0.1-0.2 μm. Diameters of the particles were evaluated from X-ray diffraction and from transmission electron microscopy and correlated with inflection points on the absorption spectra. The lowest quantum states are estimated and nonlinear optical properties measured.

Original language	English
Pages (from-to)	277-282
Number of pages	6
Journal	Chemical Physics Letters
Volume	183
Issue number	3-4
DOIs	https://doi.org/10.1016/0009-2614(91)80063-4
State	Published - 30 Aug 1991

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title = "Quantum dots of cadmium sulfide in thin glass films prepared by sol-gel technique",

abstract = "CdS quantum dots were prepared in glass films obtained from tetramethoxysilane (TMOS) or from tetraethoxysilane (TEOS) of typical thickness of 0.1-0.2 μm. Diameters of the particles were evaluated from X-ray diffraction and from transmission electron microscopy and correlated with inflection points on the absorption spectra. The lowest quantum states are estimated and nonlinear optical properties measured.",

author = "Harry Minti and Marek Eyal and Renata Reisfeld and Garry Berkovic",

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AU - Minti, Harry

AU - Eyal, Marek

AU - Reisfeld, Renata

AU - Berkovic, Garry

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Y1 - 1991/8/30

N2 - CdS quantum dots were prepared in glass films obtained from tetramethoxysilane (TMOS) or from tetraethoxysilane (TEOS) of typical thickness of 0.1-0.2 μm. Diameters of the particles were evaluated from X-ray diffraction and from transmission electron microscopy and correlated with inflection points on the absorption spectra. The lowest quantum states are estimated and nonlinear optical properties measured.

AB - CdS quantum dots were prepared in glass films obtained from tetramethoxysilane (TMOS) or from tetraethoxysilane (TEOS) of typical thickness of 0.1-0.2 μm. Diameters of the particles were evaluated from X-ray diffraction and from transmission electron microscopy and correlated with inflection points on the absorption spectra. The lowest quantum states are estimated and nonlinear optical properties measured.

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Quantum dots of cadmium sulfide in thin glass films prepared by sol-gel technique

Abstract

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