TY - JOUR
T1 - Quantum Metrology Enhanced by Repetitive Quantum Error Correction
AU - Unden, Thomas
AU - Balasubramanian, Priya
AU - Louzon, Daniel
AU - Vinkler, Yuval
AU - Plenio, Martin B.
AU - Markham, Matthew
AU - Twitchen, Daniel
AU - Stacey, Alastair
AU - Lovchinsky, Igor
AU - Sushkov, Alexander O.
AU - Lukin, Mikhail D.
AU - Retzker, Alex
AU - Naydenov, Boris
AU - McGuinness, Liam P.
AU - Jelezko, Fedor
N1 - Publisher Copyright:
© 2016 American Physical Society.
PY - 2016/6/9
Y1 - 2016/6/9
N2 - We experimentally demonstrate the protection of a room-temperature hybrid spin register against environmental decoherence by performing repeated quantum error correction whilst maintaining sensitivity to signal fields. We use a long-lived nuclear spin to correct multiple phase errors on a sensitive electron spin in diamond and realize magnetic field sensing beyond the time scales set by natural decoherence. The universal extension of sensing time, robust to noise at any frequency, demonstrates the definitive advantage entangled multiqubit systems provide for quantum sensing and offers an important complement to quantum control techniques.
AB - We experimentally demonstrate the protection of a room-temperature hybrid spin register against environmental decoherence by performing repeated quantum error correction whilst maintaining sensitivity to signal fields. We use a long-lived nuclear spin to correct multiple phase errors on a sensitive electron spin in diamond and realize magnetic field sensing beyond the time scales set by natural decoherence. The universal extension of sensing time, robust to noise at any frequency, demonstrates the definitive advantage entangled multiqubit systems provide for quantum sensing and offers an important complement to quantum control techniques.
UR - http://www.scopus.com/inward/record.url?scp=84974588880&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.116.230502
DO - 10.1103/PhysRevLett.116.230502
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AN - SCOPUS:84974588880
SN - 0031-9007
VL - 116
JO - Physical Review Letters
JF - Physical Review Letters
IS - 23
M1 - 230502
ER -