Rapid high-dimensional entanglement characterization from compressive measurements

Gregory A. Howland, John C. Howell

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We experimentally demonstrate rapid characterization of a high-dimensional entangled channel using compressive sensing. Unlike basis scan, this technique effectively scales to large dimensions and efficiently handles very low flux signals.

Original languageEnglish
Title of host publicationFrontiers in Optics, FIO 2012
PublisherOptical Society of America (OSA)
ISBN (Print)9781557529565
DOIs
StatePublished - 2012
Externally publishedYes
EventFrontiers in Optics, FIO 2012 - Rochester, NY, United States
Duration: 14 Oct 201218 Oct 2012

Publication series

NameFrontiers in Optics, FIO 2012

Conference

ConferenceFrontiers in Optics, FIO 2012
Country/TerritoryUnited States
CityRochester, NY
Period14/10/1218/10/12

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