Rapid nondestructive method for measuring the refractive index and thickness of thin dielectric films

Keyphrases

• Refractive Index 100%
• Non-destructive Method 100%
• Dielectric Thin Films 100%
• Angstrom 50%
• Computer Control 50%
• Industry-based 50%
• Rapid Measurement 50%
• Film Thickness 50%
• Microelectronics 50%
• Interferometric Techniques 50%
• Optical Thickness 50%
• Research Laboratories 50%
• Transparent Film 50%
• Non-destructive Measurement 50%
• Dielectric Film 50%
• Thin Film Technology 50%
• Only in Research 50%
• Thickness Fringes 50%

Engineering

• Refractive Index 100%
• Refractivity 100%
• Dielectric Film 100%
• Microelectronics 50%
• Thin Films 50%
• Research Laboratories 50%
• Film Technology 50%
• Interferometric Method 50%
• Computer Control 50%

Material Science

• Refractive Index 100%
• Dielectric Film 100%
• Thin Films 50%
• Film 50%
• Film Thickness 50%