Robust statistics in shape fitting

A. Stein; M. Werman

doi:10.1109/CVPR.1992.223138

Robust statistics in shape fitting

A. Stein, M. Werman

The Rachel and Selim Benin School of Engineering and Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

18 Scopus citations

Abstract

The concept of robustness in statistics is examined. Starting from the concepts of the breakdown point and equivariance properties of an estimator, the desired equivariance properties for shape fitting are defined, and high breakdown point methods with these properties are found.

Original language	English
Title of host publication	Proceedings CVPR 1992 - IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Publisher	IEEE Computer Society
Pages	540-546
Number of pages	7
ISBN (Electronic)	0818628553
DOIs	https://doi.org/10.1109/CVPR.1992.223138
State	Published - 1992
Event	1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 1992 - Champaign, United States Duration: 15 Jun 1992 → 18 Jun 1992

Publication series

Name	Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume	1992-June
ISSN (Print)	1063-6919

Conference

Conference	1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 1992
Country/Territory	United States
City	Champaign
Period	15/06/92 → 18/06/92

Bibliographical note

Publisher Copyright:
© 1992 IEEE.

Access to Document

10.1109/CVPR.1992.223138

Cite this

Stein, A., & Werman, M. (1992). Robust statistics in shape fitting. In Proceedings CVPR 1992 - IEEE Computer Society Conference on Computer Vision and Pattern Recognition (pp. 540-546). Article 223138 (Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition; Vol. 1992-June). IEEE Computer Society. https://doi.org/10.1109/CVPR.1992.223138

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doi = "10.1109/CVPR.1992.223138",

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Stein, A & Werman, M 1992, Robust statistics in shape fitting. in Proceedings CVPR 1992 - IEEE Computer Society Conference on Computer Vision and Pattern Recognition., 223138, Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, vol. 1992-June, IEEE Computer Society, pp. 540-546, 1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 1992, Champaign, United States, 15/06/92. https://doi.org/10.1109/CVPR.1992.223138

Robust statistics in shape fitting. / Stein, A.; Werman, M.
Proceedings CVPR 1992 - IEEE Computer Society Conference on Computer Vision and Pattern Recognition. IEEE Computer Society, 1992. p. 540-546 223138 (Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition; Vol. 1992-June).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Robust statistics in shape fitting

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