Scanning Electrochemical Microscopy: A New Technique for the Characterization and Modification of Surfaces

Allen J. Bard*, Guy Denuault, Chongmok Lee, Daniel Mandler, David O. Wipf

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

316 Scopus citations
Original languageAmerican English
Pages (from-to)357-363
Number of pages7
JournalAccounts of Chemical Research
Volume23
Issue number11
DOIs
StatePublished - 1 Nov 1990
Externally publishedYes

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