Scanning Electrochemical Microscopy: A New Technique for the Characterization and Modification of Surfaces

Allen J. Bard; Guy Denuault; Chongmok Lee; Daniel Mandler; David O. Wipf

doi:10.1021/ar00179a002

Scanning Electrochemical Microscopy: A New Technique for the Characterization and Modification of Surfaces

Allen J. Bard^*
, Guy Denuault
, Chongmok Lee
, Daniel Mandler
, David O. Wipf

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

332 Scopus citations

Original language	English
Pages (from-to)	357-363
Number of pages	7
Journal	Accounts of Chemical Research
Volume	23
Issue number	11
DOIs	https://doi.org/10.1021/ar00179a002
State	Published - 1 Nov 1990
Externally published	Yes

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title = "Scanning Electrochemical Microscopy: A New Technique for the Characterization and Modification of Surfaces",

author = "Bard, \{Allen J.\} and Guy Denuault and Chongmok Lee and Daniel Mandler and Wipf, \{David O.\}",

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AU - Bard, Allen J.

AU - Denuault, Guy

AU - Lee, Chongmok

AU - Mandler, Daniel

AU - Wipf, David O.

PY - 1990/11/1

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Scanning Electrochemical Microscopy: A New Technique for the Characterization and Modification of Surfaces

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