TY - JOUR
T1 - Scanning electron microscope observations on soil crusts and their formation
AU - Chen, Y.
AU - Tarchitzky, J.
AU - Brouwer, J.
AU - Morin, J.
AU - Banin, A.
PY - 1980/7
Y1 - 1980/7
N2 - Scanning electron micrographs (SEM) of crusts of loessial soils are presented. SEM observations were performed on crusts formed by raindrop impact at various stages of their formation. The crust structure was compared to the natural undisturbed soil. During the crust formation, a middle-term stage developed at which coarse particles, stripped of the fine ones, composed the surface layer of the soil. At the final stage of the crust formation, the coarse particles were washed away, and a thin seal skin, about 0.1 millimeter thick, formed the uppermost layer of the soil. A depositional crust, which was formed mainly by the translocation of fine particles, was marked by the presence of a thin skin also about 0.1 millimeter thick, suggesting involvement of similar secondary mechanisms of formation. This work illustrates the use of SEM for the study of soil crust formation and structure.
AB - Scanning electron micrographs (SEM) of crusts of loessial soils are presented. SEM observations were performed on crusts formed by raindrop impact at various stages of their formation. The crust structure was compared to the natural undisturbed soil. During the crust formation, a middle-term stage developed at which coarse particles, stripped of the fine ones, composed the surface layer of the soil. At the final stage of the crust formation, the coarse particles were washed away, and a thin seal skin, about 0.1 millimeter thick, formed the uppermost layer of the soil. A depositional crust, which was formed mainly by the translocation of fine particles, was marked by the presence of a thin skin also about 0.1 millimeter thick, suggesting involvement of similar secondary mechanisms of formation. This work illustrates the use of SEM for the study of soil crust formation and structure.
UR - http://www.scopus.com/inward/record.url?scp=0019178712&partnerID=8YFLogxK
U2 - 10.1097/00010694-198007000-00008
DO - 10.1097/00010694-198007000-00008
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AN - SCOPUS:0019178712
SN - 0038-075X
VL - 130
SP - 49
EP - 55
JO - Soil Science
JF - Soil Science
IS - 1
ER -