Scanning tunneling spectroscopy characterization of the pseudogap and the x= 1 8 anomaly in La2-x Srx Cu O4 thin films

Ofer Yuli*, Itay Asulin, Oded Millo, Gad Koren

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Using scanning tunneling spectroscopy we examined the local density of states of thin c -axis La2-x Srx Cu O4 films, over wide doping and temperature ranges. We found that the pseudogap exists only at doping levels lower than optimal. For x=0.12, close to the "anomalous" x= 1 8 doping level, a zero-bias conductance peak was the dominant spectral feature, instead of the excepted V-shaped (c -axis tunneling) gap structure. We have established that this surprising effect cannot be explained by tunneling into (110) facets. Possible origins for this unique behavior are discussed.

Original languageEnglish
Article number184521
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume75
Issue number18
DOIs
StatePublished - 22 May 2007

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