Similarity and Affine Distance Between 2d Point Sets

M Werman; D Weinshall

doi:10.1109/ICPR.1994.576419

Similarity and Affine Distance Between 2d Point Sets

M Werman, D Weinshall

The Rachel and Selim Benin School of Engineering and Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We develop expressions for measuring the distance between 2D point sets, which are invariant to either 2D affine transformations or 2D similarity transformations of the sets, and assuming a known correspondence between the point sets. Moreover, it makes it possible to compute the distance between images under different conditions, including cases where the images are treated asymmetrically. We demonstrate these results with real images.

Original language	American English
Title of host publication	Proceedings Of The 12th IAPR International Conference On Pattern Recognition
Subtitle of host publication	Conference A: Computer Vision & Image Processing
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	723-725
Number of pages	3
DOIs	https://doi.org/10.1109/ICPR.1994.576419
State	Published - 1994
Event	12th IAPR International Conference on Pattern Recognition , ICPR '94 - Jerusalem, Israel Duration: 9 Oct 1994 → 13 Oct 1994 Conference number: 12

Publication series

Name	Proceedings - International Conference on Pattern Recognition
Publisher	IEEE
Volume	1

Conference

Conference	12th IAPR International Conference on Pattern Recognition , ICPR '94
Abbreviated title	ICPR '94
Country/Territory	Israel
City	Jerusalem
Period	9/10/94 → 13/10/94

Keywords

2D affine invariance
2D similarity invariance
Pattern analysis

Access to Document

10.1109/ICPR.1994.576419

Cite this

Werman, M., & Weinshall, D. (1994). Similarity and Affine Distance Between 2d Point Sets. In Proceedings Of The 12th IAPR International Conference On Pattern Recognition: Conference A: Computer Vision & Image Processing (pp. 723-725). (Proceedings - International Conference on Pattern Recognition; Vol. 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICPR.1994.576419

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title = "Similarity and Affine Distance Between 2d Point Sets",

abstract = "We develop expressions for measuring the distance between 2D point sets, which are invariant to either 2D affine transformations or 2D similarity transformations of the sets, and assuming a known correspondence between the point sets. Moreover, it makes it possible to compute the distance between images under different conditions, including cases where the images are treated asymmetrically. We demonstrate these results with real images.",

keywords = "2D affine invariance, 2D similarity invariance, Pattern analysis",

author = "M Werman and D Weinshall",

year = "1994",

doi = "10.1109/ICPR.1994.576419",

language = "American English",

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pages = "723--725",

booktitle = "Proceedings Of The 12th IAPR International Conference On Pattern Recognition",

address = "United States",

note = "12th IAPR International Conference on Pattern Recognition , ICPR '94, ICPR '94 ; Conference date: 09-10-1994 Through 13-10-1994",

}

Werman, M & Weinshall, D 1994, Similarity and Affine Distance Between 2d Point Sets. in Proceedings Of The 12th IAPR International Conference On Pattern Recognition: Conference A: Computer Vision & Image Processing. Proceedings - International Conference on Pattern Recognition, vol. 1, Institute of Electrical and Electronics Engineers Inc., pp. 723-725, 12th IAPR International Conference on Pattern Recognition , ICPR '94, Jerusalem, Israel, 9/10/94. https://doi.org/10.1109/ICPR.1994.576419

Similarity and Affine Distance Between 2d Point Sets. / Werman, M ; Weinshall, D.
Proceedings Of The 12th IAPR International Conference On Pattern Recognition: Conference A: Computer Vision & Image Processing. Institute of Electrical and Electronics Engineers Inc., 1994. p. 723-725 (Proceedings - International Conference on Pattern Recognition; Vol. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - We develop expressions for measuring the distance between 2D point sets, which are invariant to either 2D affine transformations or 2D similarity transformations of the sets, and assuming a known correspondence between the point sets. Moreover, it makes it possible to compute the distance between images under different conditions, including cases where the images are treated asymmetrically. We demonstrate these results with real images.

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KW - 2D similarity invariance

KW - Pattern analysis

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BT - Proceedings Of The 12th IAPR International Conference On Pattern Recognition

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Werman M , Weinshall D. Similarity and Affine Distance Between 2d Point Sets. In Proceedings Of The 12th IAPR International Conference On Pattern Recognition: Conference A: Computer Vision & Image Processing. Institute of Electrical and Electronics Engineers Inc. 1994. p. 723-725. (Proceedings - International Conference on Pattern Recognition). doi: 10.1109/ICPR.1994.576419

Similarity and Affine Distance Between 2d Point Sets

Abstract

Publication series

Conference

Keywords

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