Single-shot non-intercepting profile monitor of plasma-accelerated electron beams with nanometric resolution

A. Curcio, M. Anania, F. Bisesto, E. Chiadroni, A. Cianchi, M. Ferrario, F. Filippi, D. Giulietti, A. Marocchino, F. Mira, M. Petrarca, V. Shpakov, A. Zigler

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

An innovative, single-shot, non-intercepting monitor of the transverse profile of plasma-accelerated electron beams is presented, based on the simultaneous measurement of the electron energy and the betatron radiation spectra. The spatial resolution is shown to be down to few tens of nanometers, important for high-precision applications requiring fine shaping of beams and detailed characterizations of the electron transverse phase space at the exit of plasma accelerating structures.

Original languageEnglish
Article number133105
JournalApplied Physics Letters
Volume111
Issue number13
DOIs
StatePublished - 25 Sep 2017

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