Single-shot non-intercepting profile monitor of plasma-accelerated electron beams with nanometric resolution

A. Curcio; M. Anania; F. Bisesto; E. Chiadroni; A. Cianchi; M. Ferrario; F. Filippi; D. Giulietti; A. Marocchino; F. Mira; M. Petrarca; V. Shpakov; A. Zigler

doi:10.1063/1.4998932

Single-shot non-intercepting profile monitor of plasma-accelerated electron beams with nanometric resolution

A. Curcio
, M. Anania
, F. Bisesto
, E. Chiadroni
, A. Cianchi
, M. Ferrario
, F. Filippi
, D. Giulietti
, A. Marocchino
, F. Mira
, M. Petrarca
, V. Shpakov
, A. Zigler

Racah Institute of Physics

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

An innovative, single-shot, non-intercepting monitor of the transverse profile of plasma-accelerated electron beams is presented, based on the simultaneous measurement of the electron energy and the betatron radiation spectra. The spatial resolution is shown to be down to few tens of nanometers, important for high-precision applications requiring fine shaping of beams and detailed characterizations of the electron transverse phase space at the exit of plasma accelerating structures.

Original language	English
Article number	133105
Journal	Applied Physics Letters
Volume	111
Issue number	13
DOIs	https://doi.org/10.1063/1.4998932
State	Published - 25 Sep 2017

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Publisher Copyright:
© 2017 Author(s).

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Curcio, A., Anania, M., Bisesto, F., Chiadroni, E., Cianchi, A., Ferrario, M., Filippi, F., Giulietti, D., Marocchino, A., Mira, F., Petrarca, M., Shpakov, V., & Zigler, A. (2017). Single-shot non-intercepting profile monitor of plasma-accelerated electron beams with nanometric resolution. Applied Physics Letters, 111(13), Article 133105. https://doi.org/10.1063/1.4998932

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AU - Bisesto, F.

AU - Chiadroni, E.

AU - Cianchi, A.

AU - Ferrario, M.

AU - Filippi, F.

AU - Giulietti, D.

AU - Marocchino, A.

AU - Mira, F.

AU - Petrarca, M.

AU - Shpakov, V.

AU - Zigler, A.

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Single-shot non-intercepting profile monitor of plasma-accelerated electron beams with nanometric resolution

Abstract

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