Small-angle x-ray scattering from the surfaces of reversed-phase silicas: Power-law scattering exponents of magnitudes greater than four

Paul W. Schmidt*, David Avnir, David Levy, Axel Höhr, Mathias Steiner, Armin Röll

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

155 Scopus citations

Abstract

The small-angle x-ray scattering from fully and partially derivatized porous silicas has been studied. Power-law-scattering exponents of magnitude greater than 4 have been found in all cases. The magnitudes of the exponents increased with the alkyl chain length and with the degree of surface derivatization. In a preliminary model to explain these observations, a power-law-scattering exponent with magnitude greater than 4 is related to a "fuzzy" pore boundary, in which the density varies continuously at the pore boundary instead of changing discontinuously from a value of zero in the empty pore to the essentially constant density characteristic of the bulk silica, as is usually assumed in analyses of the small-angle scattering from porous silicas.

Original languageEnglish
Pages (from-to)1474-1479
Number of pages6
JournalThe Journal of Chemical Physics
Volume94
Issue number2
DOIs
StatePublished - 1991

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