TY - JOUR
T1 - Space charge layers at the porous silicon surface
AU - Weisz, S. Z.
AU - Avalos, J.
AU - Gomez, M.
AU - Many, A.
AU - Goldstein, Y.
AU - Savir, E.
PY - 1995
Y1 - 1995
N2 - Pulse measurements on the porous-Si/electrolyte system are used to determine the surface effective area and the surface-state density at various stages of the anodization process used to produce the porous material. The measurements are combined with studies of the luminescence spectra and scanning tunneling microscopy. Preliminary results indicate that for 1-2 minute anodization, the roughness scale is of the order of 1-2 nm. On the other hand, after 10 minutes anodization the roughness microstructure becomes finer. These findings indicates that the various characteristics studied are closely interrelated.
AB - Pulse measurements on the porous-Si/electrolyte system are used to determine the surface effective area and the surface-state density at various stages of the anodization process used to produce the porous material. The measurements are combined with studies of the luminescence spectra and scanning tunneling microscopy. Preliminary results indicate that for 1-2 minute anodization, the roughness scale is of the order of 1-2 nm. On the other hand, after 10 minutes anodization the roughness microstructure becomes finer. These findings indicates that the various characteristics studied are closely interrelated.
UR - http://www.scopus.com/inward/record.url?scp=0029529820&partnerID=8YFLogxK
U2 - 10.1557/proc-378-899
DO - 10.1557/proc-378-899
M3 - ???researchoutput.researchoutputtypes.contributiontojournal.conferencearticle???
AN - SCOPUS:0029529820
SN - 0272-9172
VL - 378
SP - 899
EP - 904
JO - Materials Research Society Symposium - Proceedings
JF - Materials Research Society Symposium - Proceedings
T2 - Proceedings of the 1995 MRS Spring Meeting
Y2 - 17 April 1995 through 21 April 1995
ER -