Spectrally gated microscopy (SGM) with flat optics

Eitan Edrei*, Aharon Weiss, Jacob Engelberg, Roy Zektzer, Uriel Levy

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

We introduce a new optical modality to enable three-dimensional imaging by rejecting out-of-focus light via spectral gating. Our modality doesn't require axial physical scanning and can potentially achieve better sectioning capabilities than current state-of-the-art technology.

Original languageAmerican English
Article numberAW4N.3
JournalOptics InfoBase Conference Papers
StatePublished - 2021
EventCLEO: Applications and Technology, CLEO:A and T 2021 - Part of Conference on Lasers and Electro-Optics, CLEO 2021 - Virtual, Online, United States
Duration: 9 May 202114 May 2021

Bibliographical note

Publisher Copyright:
© OSA 2021, © 2021 The Author(s)

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