Spectrally Gated Microscopy (SGM) with Meta Optics for Parallel Three-Dimensional Imaging

Eitan Edrei, Aharon Weiss, Jacob Engelberg, Roy Zektzer, Noa Mazurski, Uriel Levy*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Volumetric imaging with high spatiotemporal resolution is of utmost importance for various applications ranging from aerospace and defense to real-time imaging of dynamic biological processes. To facilitate three-dimensional sectioning, current technology relies on mechanisms to reject light from adjacent out-of-focus planes either spatially or by other means. Yet, the combination of rapid acquisition time and high axial resolution is still elusive, motivating a persistent pursuit for emerging imaging approaches. Here we introduce and experimentally demonstrate a concept named spectrally gated microscopy (SGM), which enables a single-shot interrogation over the full axial dimension while maintaining a submicron sectioning resolution. SGM utilizes two important features enabled by flat optics (i.e., metalenses or diffractive lenses), namely, a short focal length and strong chromatic aberrations. Using SGM we demonstrate three-dimensional imaging of millimeter-scale samples while scanning only the lateral dimension, presenting a significant advantage over state-of-the-art technology.

Original languageAmerican English
Pages (from-to)17375-17383
Number of pages9
JournalACS Nano
Volume15
Issue number11
DOIs
StatePublished - 23 Nov 2021

Bibliographical note

Publisher Copyright:
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Keywords

  • flat optics
  • metalens
  • microscopy
  • three-dimensional imaging
  • tomography

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