Spectroscopic diagnostics on low aspect-ratio tokamaks

D. Stutman*, Y. S. Hwang, M. Ono, M. Finkenthal, H. W. Moos

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Low aspect-ratio tokamaks (LARTs) have intrinsic features which require specific diagnostics for particle transport and confinement studies. Such spectroscopic diagnostics are developed in collaboration between the CDX-U group at Princeton Plasma Physics Laboratory and the Plasma Spectroscopy group at Johns Hopkins University. This paper presents results obtained from the low aspect-ratio CDX-U tokamak, as well as future diagnostic developments for CDX-U and other LARTs. These results are based on spectroscopy in the VUV (500 Å - 2000 Å) using a multiple grating normal incidence spectrometer equipped with an optical multichannel analyzer, and in the XUV range on emission recorded using multilayer mirror devices.

Original languageEnglish
Pages (from-to)249-254
Number of pages6
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume80
DOIs
StatePublished - May 1996
Externally publishedYes

Fingerprint

Dive into the research topics of 'Spectroscopic diagnostics on low aspect-ratio tokamaks'. Together they form a unique fingerprint.

Cite this