Spin cast thin films of fullerenes and fluorinated fullerenes: Preparation and characterization by x-ray reflectivity and surface diffuse x-ray scattering

I. Belaish*, I. Entin, R. Goffer, D. Davidov, H. Selig, J. P. McCauley, N. Coustel, J. E. Fischer, A. B. Smith

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

We demonstrate that high quality thin films of fullerenes (C60) and fluorinated fullerenes can be prepared from solution by the spin coating technique on float glass or silicon wafers. The films were characterized by x-ray reflectivity and diffuse x-ray scattering. A systematic study of films of different thicknesses allows estimation of the distance between the fullerenes spheres to be 10.9±1 Å in our C60 films. The C 60 film-air surface is very smooth. Annealing in air above 90°C leads to an irreversible increase of the film thickness, which is attributed, at present, to oxidation.

Original languageEnglish
Pages (from-to)5248-5250
Number of pages3
JournalJournal of Applied Physics
Volume71
Issue number10
DOIs
StatePublished - 1992

Fingerprint

Dive into the research topics of 'Spin cast thin films of fullerenes and fluorinated fullerenes: Preparation and characterization by x-ray reflectivity and surface diffuse x-ray scattering'. Together they form a unique fingerprint.

Cite this