Abstract
Measurements of the deep state distribution and the ambipolar diffusion length were carried out on the same n-type a-Si:H materials. It was found that the concentration of active recombination centers [D-] is proportional to N1/2P, where NP is the total concentration of deep states. This result indicates that states other than D- states are present around the midgap of P-doped materials, and that the other states are probably associated with donor-D- pairs.
| Original language | English |
|---|---|
| Pages (from-to) | 215-218 |
| Number of pages | 4 |
| Journal | Journal of Applied Physics |
| Volume | 66 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1989 |