TY - JOUR
T1 - Statistics of electron tunneling in normal tunnel junctions
T2 - An analytical and numerical study including circuit effects
AU - Hakonen, P. J.
AU - Paila, A.
AU - Sonin, E. B.
PY - 2006
Y1 - 2006
N2 - Statistics of electron tunneling in normal tunnel junctions is studied analytically and numerically taking into account circuit (environment) effects. Full counting statistics, as well as full statistics of voltage and phase have been found for arbitrary times of observation. The theoretical analysis was based on the classical master equation, whereas the numerical simulations employed standard Monte-Carlo methods.
AB - Statistics of electron tunneling in normal tunnel junctions is studied analytically and numerically taking into account circuit (environment) effects. Full counting statistics, as well as full statistics of voltage and phase have been found for arbitrary times of observation. The theoretical analysis was based on the classical master equation, whereas the numerical simulations employed standard Monte-Carlo methods.
UR - http://www.scopus.com/inward/record.url?scp=33750986761&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.74.195322
DO - 10.1103/PhysRevB.74.195322
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AN - SCOPUS:33750986761
SN - 1098-0121
VL - 74
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 19
M1 - 195322
ER -