TY - JOUR
T1 - Stochastic Model of Breakdown Nucleation under Intense Electric Fields
AU - Engelberg, Eliyahu Zvi
AU - Ashkenazy, Yinon
AU - Assaf, Michael
N1 - Publisher Copyright:
© 2018 American Physical Society.
PY - 2018/3/20
Y1 - 2018/3/20
N2 - A plastic response due to dislocation activity under intense electric fields is proposed as a source of breakdown. A model is formulated based on stochastic multiplication and arrest under the stress generated by the field. A critical transition in the dislocation population is suggested as the cause of protrusion formation leading to subsequent arcing. The model is studied using Monte Carlo simulations and theoretical analysis, yielding a simplified dependence of the breakdown rates on the electric field. These agree with experimental observations of field and temperature breakdown dependencies.
AB - A plastic response due to dislocation activity under intense electric fields is proposed as a source of breakdown. A model is formulated based on stochastic multiplication and arrest under the stress generated by the field. A critical transition in the dislocation population is suggested as the cause of protrusion formation leading to subsequent arcing. The model is studied using Monte Carlo simulations and theoretical analysis, yielding a simplified dependence of the breakdown rates on the electric field. These agree with experimental observations of field and temperature breakdown dependencies.
UR - http://www.scopus.com/inward/record.url?scp=85044433718&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.120.124801
DO - 10.1103/PhysRevLett.120.124801
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C2 - 29694073
AN - SCOPUS:85044433718
SN - 0031-9007
VL - 120
JO - Physical Review Letters
JF - Physical Review Letters
IS - 12
M1 - 124801
ER -