Stochastic Model of Breakdown Nucleation under Intense Electric Fields

Eliyahu Zvi Engelberg, Yinon Ashkenazy, Michael Assaf

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28 Scopus citations

Abstract

A plastic response due to dislocation activity under intense electric fields is proposed as a source of breakdown. A model is formulated based on stochastic multiplication and arrest under the stress generated by the field. A critical transition in the dislocation population is suggested as the cause of protrusion formation leading to subsequent arcing. The model is studied using Monte Carlo simulations and theoretical analysis, yielding a simplified dependence of the breakdown rates on the electric field. These agree with experimental observations of field and temperature breakdown dependencies.

Original languageAmerican English
Article number124801
JournalPhysical Review Letters
Volume120
Issue number12
DOIs
StatePublished - 20 Mar 2018

Bibliographical note

Publisher Copyright:
© 2018 American Physical Society.

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