TY - JOUR
T1 - Studies of thin smectic C* films by X-ray reflectivity
AU - Marinov, O.
AU - Olbrich, E.
AU - Cohen, G.
AU - Entin, I.
AU - Davidov, D.
PY - 1993/11/15
Y1 - 1993/11/15
N2 - The smectic order in thin and ultra thin films (150-600Å) of the chiral ferroelectric liquid crystal mixture ZLI-3654 is studied using the X-ray reflectivity technique. The spin cast films on various substrates (float glass, Si wafer, polymer coated glass, etc.) order spontaneously with smectic layering parallel to the substrate surface. A simple model which assumes a sinusoidal density modulation can describe well the experimental reflectivity profiles. The X-ray reflectivity provides a method to evaluate the phases of the structure factor. We demonstrate, for the first time, that is possible to extract the molecular tilt angle, α, in ferroelectric liquid crystals from X-ray reflectivity measurements of ultra thin films. The temperature dependence of the tilt angle in the smectic C* phase are almost independent of the film thickness (down to ∼200 Å) and are similar to those in the bulk.
AB - The smectic order in thin and ultra thin films (150-600Å) of the chiral ferroelectric liquid crystal mixture ZLI-3654 is studied using the X-ray reflectivity technique. The spin cast films on various substrates (float glass, Si wafer, polymer coated glass, etc.) order spontaneously with smectic layering parallel to the substrate surface. A simple model which assumes a sinusoidal density modulation can describe well the experimental reflectivity profiles. The X-ray reflectivity provides a method to evaluate the phases of the structure factor. We demonstrate, for the first time, that is possible to extract the molecular tilt angle, α, in ferroelectric liquid crystals from X-ray reflectivity measurements of ultra thin films. The temperature dependence of the tilt angle in the smectic C* phase are almost independent of the film thickness (down to ∼200 Å) and are similar to those in the bulk.
UR - http://www.scopus.com/inward/record.url?scp=4243074951&partnerID=8YFLogxK
U2 - 10.1016/0378-4371(93)90581-N
DO - 10.1016/0378-4371(93)90581-N
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AN - SCOPUS:4243074951
SN - 0378-4371
VL - 200
SP - 730
EP - 742
JO - Physica A: Statistical Mechanics and its Applications
JF - Physica A: Statistical Mechanics and its Applications
IS - 1-4
ER -