TY - JOUR
T1 - Substrate effect on the melting temperature of thin polyethylene films
AU - Wang, Y.
AU - Rafailovich, M.
AU - Sokolov, J.
AU - Gersappe, D.
AU - Araki, T.
AU - Zou, Y.
AU - Kilcoyne, A. D.L.
AU - Ade, H.
AU - Marom, G.
AU - Lustiger, A.
PY - 2006/1/20
Y1 - 2006/1/20
N2 - Strong dependence of the crystal orientation, morphology, and melting temperature (Tm) on the substrate is observed in the semicrystalline polyethylene thin films. The Tm decreases with the film thickness decrease when the film is thinner than a certain critical thickness, and the magnitude of the depression increases with increasing surface interaction. We attribute the large Tm depression to the decrease in the overall free energy on melting, which is caused by the substrate attraction force to the chains that competes against the interchain force which drives the chains to crystallization.
AB - Strong dependence of the crystal orientation, morphology, and melting temperature (Tm) on the substrate is observed in the semicrystalline polyethylene thin films. The Tm decreases with the film thickness decrease when the film is thinner than a certain critical thickness, and the magnitude of the depression increases with increasing surface interaction. We attribute the large Tm depression to the decrease in the overall free energy on melting, which is caused by the substrate attraction force to the chains that competes against the interchain force which drives the chains to crystallization.
UR - http://www.scopus.com/inward/record.url?scp=32644487784&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.96.028303
DO - 10.1103/PhysRevLett.96.028303
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C2 - 16486656
AN - SCOPUS:32644487784
SN - 0031-9007
VL - 96
JO - Physical Review Letters
JF - Physical Review Letters
IS - 2
M1 - 028303
ER -