Super-resolution fluorescence near-field scanning optical microscopy

A. Harootunian; E. Betzig; M. Isaacson; A. Lewis

doi:10.1063/1.97565

Super-resolution fluorescence near-field scanning optical microscopy

A. Harootunian^*
, E. Betzig
, M. Isaacson
, A. Lewis

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

284 Scopus citations

Abstract

A one-dimensional near-field scanning optical microscope (NSOM) operating in the fluorescence mode has been demonstrated. NSOM line scans of both metallic edges and fluorescent gratings have been obtained and quantitatively compared to both scanning electron micrographs and conventional optical micrographs of the same structures. The sharpness of the near-field scans indicates resolution of <100 nm.

Original language	English
Pages (from-to)	674-676
Number of pages	3
Journal	Applied Physics Letters
Volume	49
Issue number	11
DOIs	https://doi.org/10.1063/1.97565
State	Published - 1986
Externally published	Yes

Access to Document

10.1063/1.97565

Cite this

@article{9ac0d4f6985b45ec9a3e865ecf3865b9,

title = "Super-resolution fluorescence near-field scanning optical microscopy",

abstract = "A one-dimensional near-field scanning optical microscope (NSOM) operating in the fluorescence mode has been demonstrated. NSOM line scans of both metallic edges and fluorescent gratings have been obtained and quantitatively compared to both scanning electron micrographs and conventional optical micrographs of the same structures. The sharpness of the near-field scans indicates resolution of <100 nm.",

author = "A. Harootunian and E. Betzig and M. Isaacson and A. Lewis",

year = "1986",

doi = "10.1063/1.97565",

language = "אנגלית",

volume = "49",

pages = "674--676",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "11",

}

TY - JOUR

T1 - Super-resolution fluorescence near-field scanning optical microscopy

AU - Harootunian, A.

AU - Betzig, E.

AU - Isaacson, M.

AU - Lewis, A.

PY - 1986

Y1 - 1986

N2 - A one-dimensional near-field scanning optical microscope (NSOM) operating in the fluorescence mode has been demonstrated. NSOM line scans of both metallic edges and fluorescent gratings have been obtained and quantitatively compared to both scanning electron micrographs and conventional optical micrographs of the same structures. The sharpness of the near-field scans indicates resolution of <100 nm.

AB - A one-dimensional near-field scanning optical microscope (NSOM) operating in the fluorescence mode has been demonstrated. NSOM line scans of both metallic edges and fluorescent gratings have been obtained and quantitatively compared to both scanning electron micrographs and conventional optical micrographs of the same structures. The sharpness of the near-field scans indicates resolution of <100 nm.

UR - https://www.scopus.com/pages/publications/36549091231

U2 - 10.1063/1.97565

DO - 10.1063/1.97565

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:36549091231

SN - 0003-6951

VL - 49

SP - 674

EP - 676

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 11

ER -

Super-resolution fluorescence near-field scanning optical microscopy

Abstract

Access to Document

Other files and links

Fingerprint

Cite this