Super-resolution imaging with near-field scanning optical microscopy (NSOM)

E. Betzig*, M. Isaacson, H. Barshatzky, A. Lewis, K. Lin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Abstract

Optical imaging with resolution exceeding the diffraction limit is demonstrated with near-field scanning optical microscopy (NSOM). The concept behind the technique and its experimental implementation is discussed. Images are presented which attest to its reproducibility and super-resolution capabilities. Although distinct, NSOM has technical features in common with scanning tunneling microscopy. However, since it is optically based it also shares many of the advantages of conventional optical microscopy, including non-destructiveness, speed, flexibility, and the ability to generate contrast in numerous ways.

Original languageEnglish
Pages (from-to)155-163
Number of pages9
JournalUltramicroscopy
Volume25
Issue number2
DOIs
StatePublished - 1988
Externally publishedYes

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