Surface x-ray diffraction of complex metal oxide surfaces and interfaces - a new era

C. M. Schlepütz; P. R. Willmott; S. A. Pauli; R. Herger; D. Martoccia; M. Björck; D. Kumah; R. Clarke; Y. Yacoby

doi:10.1063/1.3086245

Surface x-ray diffraction of complex metal oxide surfaces and interfaces - a new era

C. M. Schlepütz, P. R. Willmott, S. A. Pauli, R. Herger, D. Martoccia, M. Björck, D. Kumah, R. Clarke, Y. Yacoby

Racah Institute of Physics

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

The availability of high-brilliance hard x-ray synchrotron radiation and the advent of novel photon counting area detectors have brought surface x-ray diffraction (SXRD) into a new era. It is now possible to record large numbers of structure factors with much improved reliability within reasonable beamtime durations. As a result, structural determination of the surfaces and interfaces of complex crystallographic systems and heterostructures has now become feasible, especially in conjunction with phase-retrieval methods. It is thereby hoped that detailed structural information will shed light on the unusual physical properties of these systems. Complex metal oxide systems investigated at the Materials Science beamline of the Swiss Light Source, including the surface of SrTiO₃, the interface between LaA1O₃ and SrTiO₃, and the structure of YBa₂Cu₃O ₇ grown on NdGaO₃, SrTiO₃, and (LaSr)(AlTa)O₃ will be presented as examples of what is now possible using SXRD.

Original language	English
Pages (from-to)	9-12
Number of pages	4
Journal	AIP Conference Proceedings
Volume	1092
DOIs	https://doi.org/10.1063/1.3086245
State	Published - 2009
Event	6th International Conference on Synchrotron Radiation in Materials Science - Campinas, Sao Paulo, Brazil Duration: 20 Jul 2008 → 23 Jul 2008

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@article{9529d85505b140e1a62b50b0acaa4fb0,

title = "Surface x-ray diffraction of complex metal oxide surfaces and interfaces - a new era",

abstract = "The availability of high-brilliance hard x-ray synchrotron radiation and the advent of novel photon counting area detectors have brought surface x-ray diffraction (SXRD) into a new era. It is now possible to record large numbers of structure factors with much improved reliability within reasonable beamtime durations. As a result, structural determination of the surfaces and interfaces of complex crystallographic systems and heterostructures has now become feasible, especially in conjunction with phase-retrieval methods. It is thereby hoped that detailed structural information will shed light on the unusual physical properties of these systems. Complex metal oxide systems investigated at the Materials Science beamline of the Swiss Light Source, including the surface of SrTiO3, the interface between LaA1O3 and SrTiO3, and the structure of YBa2Cu3O 7 grown on NdGaO3, SrTiO3, and (LaSr)(AlTa)O3 will be presented as examples of what is now possible using SXRD.",

author = "Schlep{\"u}tz, {C. M.} and Willmott, {P. R.} and Pauli, {S. A.} and R. Herger and D. Martoccia and M. Bj{\"o}rck and D. Kumah and R. Clarke and Y. Yacoby",

year = "2009",

doi = "10.1063/1.3086245",

language = "אנגלית",

volume = "1092",

pages = "9--12",

journal = "AIP Conference Proceedings",

issn = "0094-243X",

publisher = "American Institute of Physics",

note = "6th International Conference on Synchrotron Radiation in Materials Science ; Conference date: 20-07-2008 Through 23-07-2008",

}

TY - JOUR

T1 - Surface x-ray diffraction of complex metal oxide surfaces and interfaces - a new era

AU - Schlepütz, C. M.

AU - Willmott, P. R.

AU - Pauli, S. A.

AU - Herger, R.

AU - Martoccia, D.

AU - Björck, M.

AU - Kumah, D.

AU - Clarke, R.

AU - Yacoby, Y.

PY - 2009

Y1 - 2009

N2 - The availability of high-brilliance hard x-ray synchrotron radiation and the advent of novel photon counting area detectors have brought surface x-ray diffraction (SXRD) into a new era. It is now possible to record large numbers of structure factors with much improved reliability within reasonable beamtime durations. As a result, structural determination of the surfaces and interfaces of complex crystallographic systems and heterostructures has now become feasible, especially in conjunction with phase-retrieval methods. It is thereby hoped that detailed structural information will shed light on the unusual physical properties of these systems. Complex metal oxide systems investigated at the Materials Science beamline of the Swiss Light Source, including the surface of SrTiO3, the interface between LaA1O3 and SrTiO3, and the structure of YBa2Cu3O 7 grown on NdGaO3, SrTiO3, and (LaSr)(AlTa)O3 will be presented as examples of what is now possible using SXRD.

AB - The availability of high-brilliance hard x-ray synchrotron radiation and the advent of novel photon counting area detectors have brought surface x-ray diffraction (SXRD) into a new era. It is now possible to record large numbers of structure factors with much improved reliability within reasonable beamtime durations. As a result, structural determination of the surfaces and interfaces of complex crystallographic systems and heterostructures has now become feasible, especially in conjunction with phase-retrieval methods. It is thereby hoped that detailed structural information will shed light on the unusual physical properties of these systems. Complex metal oxide systems investigated at the Materials Science beamline of the Swiss Light Source, including the surface of SrTiO3, the interface between LaA1O3 and SrTiO3, and the structure of YBa2Cu3O 7 grown on NdGaO3, SrTiO3, and (LaSr)(AlTa)O3 will be presented as examples of what is now possible using SXRD.

UR - http://www.scopus.com/inward/record.url?scp=64849085270&partnerID=8YFLogxK

U2 - 10.1063/1.3086245

DO - 10.1063/1.3086245

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.conferencearticle???

AN - SCOPUS:64849085270

SN - 0094-243X

VL - 1092

SP - 9

EP - 12

JO - AIP Conference Proceedings

JF - AIP Conference Proceedings

T2 - 6th International Conference on Synchrotron Radiation in Materials Science

Y2 - 20 July 2008 through 23 July 2008

ER -

Surface x-ray diffraction of complex metal oxide surfaces and interfaces - a new era

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