TY - JOUR
T1 - Synthesis and characterization of single-layer silver-decanethiolate lamellar crystals
AU - Hu, Liang
AU - De La Rama, Lito P.
AU - Efremov, Mikhail Y.
AU - Anahory, Yonathan
AU - Schiettekatte, Francois
AU - Allen, Leslie H.
PY - 2011/3/30
Y1 - 2011/3/30
N2 - We report the synthesis of silver-decanethiolate (AgSC10) lamellar crystals. Nanometer-sized Ag clusters grown on inert substrates react with decanethiol vapor to form multilayer AgSC10 lamellar crystals with both layer-by-layer and in-plane ordering. The crystals have strong (010) texture with the layers parallel to the substrates. The synthesis method allows for a precise control of the number of layers. The thickness of the lamellae can be manipulated and systematically reduced to a single layer by decreasing the amount of Ag and lowering the annealing temperature. The single-layer AgSC10 lamellae are two-dimensional crystals and have uniform thickness and in-plane ordering. These samples were characterized with nanocalorimetry, atomic force microscopy (AFM), transmission electron microscopy (TEM), X-ray diffraction (XRD), X-ray reflectivity (XRR), Fourier transform infrared spectroscopy (FTIR), and Rutherford backscattering spectroscopy (RBS).
AB - We report the synthesis of silver-decanethiolate (AgSC10) lamellar crystals. Nanometer-sized Ag clusters grown on inert substrates react with decanethiol vapor to form multilayer AgSC10 lamellar crystals with both layer-by-layer and in-plane ordering. The crystals have strong (010) texture with the layers parallel to the substrates. The synthesis method allows for a precise control of the number of layers. The thickness of the lamellae can be manipulated and systematically reduced to a single layer by decreasing the amount of Ag and lowering the annealing temperature. The single-layer AgSC10 lamellae are two-dimensional crystals and have uniform thickness and in-plane ordering. These samples were characterized with nanocalorimetry, atomic force microscopy (AFM), transmission electron microscopy (TEM), X-ray diffraction (XRD), X-ray reflectivity (XRR), Fourier transform infrared spectroscopy (FTIR), and Rutherford backscattering spectroscopy (RBS).
UR - http://www.scopus.com/inward/record.url?scp=79953032971&partnerID=8YFLogxK
U2 - 10.1021/ja107817x
DO - 10.1021/ja107817x
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C2 - 21370865
AN - SCOPUS:79953032971
SN - 0002-7863
VL - 133
SP - 4367
EP - 4376
JO - Journal of the American Chemical Society
JF - Journal of the American Chemical Society
IS - 12
ER -