Tailor-made tests for goodness of fit to semiparametric hypotheses

Peter J. Bickel*, Ya'acov Ritov, Thomas M. Stoker

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

45 Scopus citations

Abstract

We introduce a new framework for constructing tests of general semi-parametric hypotheses which have nontrivial power on the n- 1/2 scale in every direction, and can be tailored to put substantial power on alternatives of importance. The approach is based on combining test statistics based on stochastic processes of score statistics with bootstrap critical values.

Original languageEnglish
Pages (from-to)721-741
Number of pages21
JournalAnnals of Statistics
Volume34
Issue number2
DOIs
StatePublished - Apr 2006

Keywords

  • Copula models
  • Independence
  • Mixture of Gaussians

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