Abstract
Phase-contrast x-ray diagnostics can detect density gradients in low-Z matter with the sensitivity and spatial resolution required in High Energy Density (HED) plasma experiments. Talbot-Lau interferometry measures x-ray beam deviations due to refraction index gradients in its path. It can simultaneously provide x-ray attenuation, refraction, elemental composition, and scatter images of a low-Z object. We have developed the Talbot-Lau Moiré X-ray Deflectometry (TXD) single image technique based on phase-retrieval. The results obtained at 8 and 17 keV with high magnification using low-Z test objects suggest a clear advantage of TXD as HED electron density diagnostic over conventional radiography. The Moiré technique can detect sharp and smooth density gradients with source-limited spatial resolution. Also, TXD can use extended, incoherent, line or continuum x-ray sources, allowing for a wide range of backlighters.
Original language | English |
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Title of host publication | 2015 IEEE 26th Symposium on Fusion Engineering, SOFE 2015 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781479982646 |
DOIs | |
State | Published - 31 May 2016 |
Externally published | Yes |
Event | 26th IEEE Symposium on Fusion Engineering, SOFE 2015 - Austin, United States Duration: 31 May 2015 → 4 Jun 2015 |
Publication series
Name | Proceedings - Symposium on Fusion Engineering |
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Volume | 2016-May |
Conference
Conference | 26th IEEE Symposium on Fusion Engineering, SOFE 2015 |
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Country/Territory | United States |
City | Austin |
Period | 31/05/15 → 4/06/15 |
Bibliographical note
Publisher Copyright:© 2015 IEEE.
Keywords
- HED diagnostic
- Phase-shift
- Refraction diagnostics
- X-ray imaging