Talbot-Lau x-ray density diagnostic for High Energy Density plasmas

M. P. Valdivia, D. Stutman, M. Finkenthal, S. P. Regan, C. Stoeckl, C. Mileham, I. Begishev

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Phase-contrast x-ray diagnostics can detect density gradients in low-Z matter with the sensitivity and spatial resolution required in High Energy Density (HED) plasma experiments. Talbot-Lau interferometry measures x-ray beam deviations due to refraction index gradients in its path. It can simultaneously provide x-ray attenuation, refraction, elemental composition, and scatter images of a low-Z object. We have developed the Talbot-Lau Moiré X-ray Deflectometry (TXD) single image technique based on phase-retrieval. The results obtained at 8 and 17 keV with high magnification using low-Z test objects suggest a clear advantage of TXD as HED electron density diagnostic over conventional radiography. The Moiré technique can detect sharp and smooth density gradients with source-limited spatial resolution. Also, TXD can use extended, incoherent, line or continuum x-ray sources, allowing for a wide range of backlighters.

Original languageEnglish
Title of host publication2015 IEEE 26th Symposium on Fusion Engineering, SOFE 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479982646
DOIs
StatePublished - 31 May 2016
Externally publishedYes
Event26th IEEE Symposium on Fusion Engineering, SOFE 2015 - Austin, United States
Duration: 31 May 20154 Jun 2015

Publication series

NameProceedings - Symposium on Fusion Engineering
Volume2016-May

Conference

Conference26th IEEE Symposium on Fusion Engineering, SOFE 2015
Country/TerritoryUnited States
CityAustin
Period31/05/154/06/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

Keywords

  • HED diagnostic
  • Phase-shift
  • Refraction diagnostics
  • X-ray imaging

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