Technical Advantages for Weak-Value Amplification

Julián Martínez-Rincón*, Gerardo I. Viza, Gabriel B. Alves, Andrew N. Jordan, John C. Howell

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We consider different types of technical noise in an optical context and show that weak-value amplification techniques (using a small fraction of photons) compare favourably with standard techniques (using all of them). We measure small beam deflections of an optical beam by monitoring the dark port in a Sagnac interferometer (weak-value technique) or by focusing the entire beam onto a split detector (standard technique). In all cases, the weak-value technique performs favourable in precision respect to the standard technique.

Original languageAmerican English
Title of host publicationLaser Science, LS 2015
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9781943580033
StatePublished - 2015
Externally publishedYes
EventLaser Science, LS 2015 - San Jose, United States
Duration: 18 Oct 201522 Oct 2015

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceLaser Science, LS 2015
Country/TerritoryUnited States
CitySan Jose
Period18/10/1522/10/15

Bibliographical note

Publisher Copyright:
© OSA 2015.

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