Abstract
We report on the dependence on temperature and disorder of the glassy behavior observed in thin films of In2O3 - x in the strongly localized regime. The glassy behavior is reflected as a local minimum at the cool-down gate voltage in the conductance vs. gate-voltage, G(Vg) sweeps of field-effect experiments. It is shown that these non-ergodic effects are controlled by an inverse-Arrhenius law and involves a characteristic energy which increases with disorder.
Original language | English |
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Pages (from-to) | 307-311 |
Number of pages | 5 |
Journal | Europhysics Letters |
Volume | 42 |
Issue number | 3 |
DOIs | |
State | Published - 1 May 1998 |