The analysis of the surface chemical structure of biomedical aliphatic polyanhydrides using XPS and ToF‐SIMS

The surface chemical structure of a range of aliphatic polyanhydride films has been examined using XPS and ToF‐SIMS. The XPS data confirms the purity of the surface, and the experimental surface elemental ratios are in good general agreement with the known stoichiometry of the polyanhydrides. The ToF‐SIMS spectra of the polyanhydrides are shown to be significantly different. The SIMS data conforms to a systematic fragmentation, in both negative‐ and positive‐ion SSIMS spectra, occurring throughout the entire series of polyanhydrides examined. Radical cations are observed in the positive‐ion spectra. These results are discussed in terms of the general fragmentation patterns observed in the SIMS analysis of polymers. The combined use of ToF‐SIMS and XPS is shown, to provide a detailed insight into the interfacial chemical structure of these polyanhydrides.