The kick-out mass selection technique for ions stored in an Electrostatic Ion Beam Trap

Y. Toker*, N. Altstein, O. Aviv, M. L. Rappaport, O. Heber, D. Schwalm, D. Strasser, D. Zajfman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

27 Scopus citations

Abstract

A simple mass selection technique which allows one to clean a keV ion beam of undesirable masses while stored in an Electrostatic Ion Beam Trap (EIBT) is described. The technique is based on the time-of-flight principle and takes advantage of the long storage times and self-bunching that are possible in this type of traps (self bunching being the effect that keeps ions of the same mass bunched in spite of their finite distributions of velocities and trajectories). As the oscillation period is proportional to the square root of the ion mass, bunches containing ions of different masses will separate in space with increasing storage time and can be kicked out by a pulsed deflector mounted inside the trap. A mass selector of this type has been implemented successfully in an EIBT connected to an Even-Lavie supersonic expansion source and is routinely used in ongoing cluster experiments.

Original languageAmerican English
Article numberP09001
JournalJournal of Instrumentation
Volume4
Issue number9
DOIs
StatePublished - 2009

Keywords

  • Instrumentation for particle accelerators and storage rings - low energy (linear accelerators, cyclotrons, electrostatic accelerators)
  • Low-energy ion storage
  • Mass spectrometers

Fingerprint

Dive into the research topics of 'The kick-out mass selection technique for ions stored in an Electrostatic Ion Beam Trap'. Together they form a unique fingerprint.

Cite this