The role of surface passivation in integrated sub-bandgap on-chip silicon photodetectors

Rivka Gherabli, Meir Grajower, Joseph Shappir, Noa Mazurski, Uriel Levy

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We demonstrate the role of passivation in silicon photonics photodetectors based on defect states operating in the sub bandgap regime. Upon passivation removal, higher responsivity is obtained alongside with loss reduction, surprisingly improving over time.

Original languageAmerican English
Title of host publication2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580576
DOIs
StatePublished - May 2019
Event2019 Conference on Lasers and Electro-Optics, CLEO 2019 - San Jose, United States
Duration: 5 May 201910 May 2019

Publication series

Name2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings

Conference

Conference2019 Conference on Lasers and Electro-Optics, CLEO 2019
Country/TerritoryUnited States
CitySan Jose
Period5/05/1910/05/19

Bibliographical note

Publisher Copyright:
© 2019 The Author(s) 2019 OSA.

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